✦ LIBER ✦
Orientation dependence of near-threshold damage production by electron irradiation of 4H SiC and diamond and outward migration of defects
✍ Scribed by J.W. Steeds
- Book ID
- 103864164
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 712 KB
- Volume
- 269
- Category
- Article
- ISSN
- 0168-583X
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