Orientation dependence of Ge diffusion along symmetrical [111] tilt grain boundaries in Al
β Scribed by T. Surholt; D.A. Molodov; Chr. Herzig
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 450 KB
- Volume
- 46
- Category
- Article
- ISSN
- 1359-6454
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π SIMILAR VOLUMES
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Stress-induced migration of planar grain boundaries in aluminum bicrystals was measured for both low-and high-angle symmetrical h1 0 0i tilt grain boundaries across the entire misorientation range (0-90Β°). Boundary migration under a shear stress was observed to be coupled to a lateral translation of