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Organic Nanoclusters on Inorganic Nanostructures for Tailoring the Emission Properties of Organic Materials

✍ Scribed by Alan Man-Ching Ng; Aleksandra B. Djurišić; Kai-Hang Tam; Wai-Ming Kwok; Wai-Kin Chan; Wing Yan Tam; David Lee Phillips; Kok-Wai Cheah


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
505 KB
Volume
18
Category
Article
ISSN
1616-301X

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O 1.5 Si-R-SiO 1.5 , obtained from bis-silylated precursors (R'O) 3 -R-Si(OR') 3 (R' = Me, Et and R = (-CH 2 ) n -