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Ordering effects in extreme high-resolution depth profiling with MeV ion beams

✍ Scribed by Harry J. Whitlow; Sachiko T. Nakagawa

Book ID: 113823396
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 330 KB
Volume: 272
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2011.01.116

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