Optimum accelerated life-tests for the Weibull and extreme value distributions : W. Q. Meeker and W. Nelson. IEEE Trans. Reliab.R-24, (5) 321 (Dec. 1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 115 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90658-2