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Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST

✍ Scribed by F. Azaïs; S. Bernard; Y. Bertrand; M. Renovell


Book ID
110309425
Publisher
Springer US
Year
2001
Tongue
English
Weight
291 KB
Volume
17
Category
Article
ISSN
0923-8174

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