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Optimized Ni Oxidation in 80-nm Contact Holes for Integration of Forming-Free and Low-Power Ni/NiO/Ni Memory Cells
✍ Scribed by Goux, L.; Lisoni, J.G.; Xin Peng Wang; Jurczak, M.; Wouters, D.J.
- Book ID
- 114619742
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 400 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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