✦ LIBER ✦
Optimization of Zn dopant profiles in a pin-diode/FET by combination of depth profiling techniques: a SIMS, ECV and AES study
✍ Scribed by J.G. Bauer; R. Treichler; T. Hillmer; J. Müller; G. Ebbinghaus
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 284 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0169-4332
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