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Optimization of the tradeoff between switching speed of the internal diode and on-resistance in gold- and platinum-implanted power metal-oxide-semiconductor devices

✍ Scribed by Catania, M.F.; Frisina, F.; Tavolo, N.; Ferla, G.; Coffia, S.; Campisano, S.U.


Book ID
114534954
Publisher
IEEE
Year
1992
Tongue
English
Weight
548 KB
Volume
39
Category
Article
ISSN
0018-9383

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