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Optimization of the InP/SiO2 interface treatment by (NH4)2Sx for the InP MISFET fabrication technology

✍ Scribed by Mathieu Petitjean; Nicole Proust; Jean-François Chapeaublanc; Jérôme Perrin


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
523 KB
Volume
33
Category
Article
ISSN
0924-4247

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