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Optimization of the electron-beam-lithography parameters for the moth-eye effects of an antireflection matrix structure

✍ Scribed by Chung-Feng Jeffrey Kuo; Hung-Min Tu; Te-Li Su


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
496 KB
Volume
102
Category
Article
ISSN
0021-8995

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