Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly

✍ Scribed by Zhen Shi; Peter Sandborn

• Publisher: Springer US
• Year: 2006
• Tongue: English
• Weight: 345 KB
• Volume: 22
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-006-6593-3