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Optimization of quantum interferometric metrological sensors in the presence of photon loss

✍ Scribed by Lee, Tae-Woo; Huver, Sean D.; Lee, Hwang; Kaplan, Lev; McCracken, Steven B.; Min, Changjun; Uskov, Dmitry B.; Wildfeuer, Christoph F.; Veronis, Georgios; Dowling, Jonathan P.

Book ID
120350066
Publisher
The American Physical Society
Year
2009
Tongue
English
Weight
175 KB
Volume
80
Category
Article
ISSN
1050-2947

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## Abstract Theoretical expressions for assessing the expected financial loss associated with the accuracy of the instrumentation and the associated probability in the presence of two and more gross errors have been developed in previous work. However, these expressions were given in a form of inte