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Optimization of Precision and Accuracy in X-Ray Fluorescence Analysis of Silicate Rocks

โœ Scribed by Bower, Nathan W.


Book ID
115360150
Publisher
Society for Applied Spectroscopy
Year
1985
Tongue
English
Weight
818 KB
Volume
39
Category
Article
ISSN
0003-7028

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An empirical method is proposed for the correction of spectral interference between characteristic lines in XRF. The procedure is based on a coefficient which includes instrumental parameters and atomic properties and is obtained with the same standards as those used in calibration. This method has