✦ LIBER ✦
Optimization of buried implanted layer in dynamic random access memories by soft error mapping and ion beam-induced current
✍ Scribed by T. Kishimoto; H. Sayama; M. Takai; Y. Ohno; K. Sonoda; T. Nishimura; A. Kinomura; Y. Horino; K. Fujii
- Book ID
- 113286580
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 349 KB
- Volume
- 104
- Category
- Article
- ISSN
- 0168-583X
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