Optimization of a novel ETV system for solid sample introduction into an ICP and its application to the determination of trace impurities in SiC

✍ Scribed by A. Golloch; M. Haveresch-Kock; F. Plantikow-Voβgätter

• Book ID: 113374987
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 973 KB
• Volume: 50
• Category: Article
• ISSN: 0584-8547
• DOI: 10.1016/0584-8547(94)00144-k