Optimised Implantation-Induced Disordering for Lowering the Threshold Current Density of II-VI Laser Diodes

✍ Scribed by Schulz, O. ;Strassburg, M. ;Pohl, U.W. ;Bimberg, D. ;Itoh, S. ;Nakano, K. ;Ishibashi, A. ;Klude, M. ;Hommel, D.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 86 KB
• Volume: 180
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200007)180:1<213::aid-pssa213>3.0.co;2-e