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Optimisation of access points for automatic test program generation and fault location in large analogue circuits and systems: M. A. Sarram, J. Hywel Williams, D. R. Towill and K. C. Verghese Radio Electron. Eng.51 (9), 435 (Sept 1981)


Book ID
108361314
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
93 KB
Volume
15
Category
Article
ISSN
0026-2692

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