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Optimal test capacity allocation in automated high-frequency testing environments

✍ Scribed by Yong-Hee Han…

Book ID: 120743141
Publisher: Springer
Year: 2011
Tongue: English
Weight: 442 KB
Volume: 62
Category: Article
ISSN: 0268-3768
DOI: 10.1007/s00170-011-3768-6

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