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Optimal sensor distribution for variation diagnosis in multistation assembly processes

โœ Scribed by Yu Ding; Pansoo Kim; D. Ceglarek; Jionghua Jin


Book ID
126608972
Publisher
IEEE
Year
2003
Tongue
English
Weight
810 KB
Volume
19
Category
Article
ISSN
1042-296X

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[Lecture Notes in Computer Science] Para
โœ Wyrzykowski, Roman; Dongarra, Jack; Paprzycki, Marcin; Waล›niewski, Jerzy ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Springer Berlin Heidelberg ๐ŸŒ English โš– 273 KB

This book constitutes the thoroughly refereed post-proceedings of the 4th International Conference on Parallel Processing and Applied Mathematics, PPAM 2002, held in Naleczow, Poland, in September 2001. The 101 papers presented were carefully reviewed and improved during two rounds of reviewing and