𝔖 Bobbio Scriptorium

✦ LIBER ✦

Optimal selection of sequential tests for reliability : J. M. Mogg. IEEE Trans. Reliab. R-26, (2) 116 (June 1977)

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 125 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)91008-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Allocation of test effort for minimum va

Allocation of test effort for minimum variance of reliability : L. Daniel Maxim and Harrison D. Weed. IEEE Trans. Reliab. R-26, (2) 111 (June 1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Optimal design of a series-parallel syst

Optimal design of a series-parallel system with time-dependent reliability : Kyoichi Nakashima and Kazuharu Yamato. IEEE Trans. Reliab.R-26, (2) 119 (June 1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 137 KB

An optimum procedure for component testi

An optimum procedure for component testing in the demonstration of series system reliability : M. Mazumdar. IEEE Trans. Reliab.R-26, (5) 342 (December 1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 94 KB

Bayesian confidence limits for the relia

Bayesian confidence limits for the reliability of mixed cascade and parallel independent exponential subsystems : J. K. Byers, R. W. Skeith and M. D. Springer. IEEE Trans. Reliab.R-23, 2, 104 (June 1974)

📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 231 KB