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Optimal plans for monitoring the metrological characteristics of instruments in a mass-production environment

✍ Scribed by I. V. Goncharov; M. I. Revyakov

Publisher: Springer US
Year: 1993
Tongue: English
Weight: 490 KB
Volume: 36
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf00978259

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