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Optimal design toward enhancement of thermomechanical reliability of polyimide layers in a flip-chip-on-lead-frame dual flat no-leads package with copper pillar bumps

✍ Scribed by Ning, Wenguo; Zhu, Chunsheng; Li, Heng; Xu, Gaowei; Luo, Le; Guo, Hongyan; Jing, Fei


Book ID
123348162
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
887 KB
Volume
16
Category
Article
ISSN
1369-8001

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