𝔖 Bobbio Scriptorium
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Optimal and near-optimal test sequencing algorithms with realistic test models

✍ Scribed by Raghavan, V.; Shakeri, M.; Pattipati, K.

Book ID
117873976
Publisher
IEEE
Year
1999
Tongue
English
Weight
503 KB
Volume
29
Category
Article
ISSN
1083-4427

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