Optimal accelerated life-time plans that minimize the maximum test-stress : Russell R. Barton. IEEE Trans. Reliab.40(2), 166 (1991)

• Book ID: 103287230
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 131 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90524-o