𝔖 Bobbio Scriptorium
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Optical studies of infrared active electronic defects in neutron irradiated silicon after annealing at 450°C

✍ Scribed by Shi, Y. ;Wu, F. M. ;Zheng, Y. D. ;Suezawa, M. ;Imai, M. ;Sumino, K.


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
556 KB
Volume
144
Category
Article
ISSN
0031-8965

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