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Optical studies of (AsSe)100−xSbxthin films

✍ Scribed by T. Petkova; V. Ilcheva; E. Petkov; P. Petkov; G. Socol; F. Sima; C. Ristoscu; C. N. Mihailescu; I. N. Mihailescu; C. Popov; J. P. Reithmaier

Publisher
Springer
Year
2011
Tongue
English
Weight
424 KB
Volume
104
Category
Article
ISSN
1432-0630

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Thin ÿlms of amorphous Se100-xSbx (x = 5; 10 and 20 at%) system are deposited on a silicon substrate at room temperature (300 K) by thermal evaporation technique. The optical constant such as refractive index (n) has been determined by a method based on the envelope curves of the optical transmissio