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Optical properties of vanadium pentoxide determined from ellipsometry and band-structure calculations

โœ Scribed by Parker, J. C.; Lam, D. J.; Xu, Y.-N.; Ching, W. Y.

Book ID
125477828
Publisher
The American Physical Society
Year
1990
Tongue
English
Weight
276 KB
Volume
42
Category
Article
ISSN
1098-0121

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โœ M Ghanashyam Krishna; A.K. Bhattacharya ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 388 KB

## The effects of dc bias on the optical and structural properties of dc magnetron sputtered vanadium pentoxide thin films are presented. It is shown that as the bias voltage is increased from 0 to -150 V the refractive index of the films goes through a maximum at -75 V and saturates thereafter. The