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Optical properties of thermally evaporated PDI-8CN2 thin films

✍ Scribed by L. Anderson; F. Di Girolamo; M. Barra; A. Cassinese; M.V. Jacob

Publisher
Elsevier
Year
2011
Tongue
English
Weight
854 KB
Volume
14
Category
Article
ISSN
1875-3892

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✦ Synopsis

The optical properties of thermally evaporated PDI-8CN 2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO 2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 -900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.

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## Abstract CdS thin films of varying thicknesses were deposited on cleaned glass substrates at room temperature by thermal evaporation technique in a vacuum of about 2 x 10^‐5^ torr. UV‐VIS spectra of the films were studied using the optical transmittance measurements which were taken in the spect