<p>This volume contains the Proceedings of the NATO Advanced Research Workshop on "Optical Properties of Narrow-Gap Low-Dimensional Structures", held from July 29th to August 1st, 1986, in St. Andrews, Scotland, under the auspices of the NATO International Scientific Exchange Program. The workshop w
Optical Properties of Low Dimensional Silicon Structures
β Scribed by V. Lehmann (auth.), Daniel C. Bensahel, Leigh T. Canham, Stephano Ossicini (eds.)
- Publisher
- Springer Netherlands
- Year
- 1993
- Tongue
- English
- Leaves
- 244
- Series
- NATO ASI Series 244
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
The workshop on "Optical Properties of Low Dimensional Silicon sL Structures" was held in Meylan, France on March, I yd, 1993. The workshop took place inside the facilities of France Telecom- CNET. Around 45 leading scientists working on this rapidly moving field were in attendance. Principal support was provided by the Advanced Research Workshop Program of the North Atlantic Treaty Organisation (NATO). French Delegation a l'Armement and CNET gave also a small financial grant, the organisational part being undertaken by the SEE and CNET. There is currently intense research activity worldwide devoted to the optical properties of low dimensional silicon structures. This follow the recent discovery of efficient visible photoluminescence (PL) from highly porous silicon. This workshop was intended to bring together all the leading European scientists and laboratories in order to reveal the state of the art and to open new research fields on this subject. A large number of invited talks took place (12) together with regular contribution (20). The speakers were asked to leave nearly 1/3 of the time to the discussion with the audience, and that promoted both formal and informal discussions between the participants.
β¦ Table of Contents
Front Matter....Pages i-xii
Microporous Silicon: Formation Mechanism and Preparation Method....Pages 1-9
Electrochemical and Chemical Behavior of Porous Silicon Layers: The Role of the Material Wettability and its High Specific Surface Area....Pages 11-22
Fabrication of Si Nanostructures for Light Emission Study....Pages 23-34
Light Emission from Porous Silicon and Other Self Organised Low Dimensional Systems....Pages 35-41
Preparation and Properties of Thin Siloxene Films on Silicon....Pages 43-54
Modelling of Porous Structures Formation during Electrochemical Treatment of Materials....Pages 55-60
Electronic Charge Trapping Effects in Porous Silicon....Pages 61-67
Mechanical, Optical and Electrical Properties of Porous Silicon Prepared under Clean Conditions....Pages 69-74
The influence of microelectronic processing steps on the properties of porous Si-layers....Pages 75-80
Progress Towards Understanding and Exploiting the Luminescent Properties of Highly Porous Silicon....Pages 81-94
βWhiteβ photoluminescence from electrochemically attacked silicon....Pages 95-100
Electrochemical Investigation of the Electroluminescent Properties of Porous Silicon....Pages 101-116
Phenomenological Properties of the Fast (Blue) and Slow (Red) Components in the Photoluminescence of Porous Silicon....Pages 117-121
Electroluminescence from porous Silicon....Pages 123-132
Optoelectronic Properties of Porous Silicon....Pages 133-138
Voltage-Tunable Electroluminescence of Porous Silicon....Pages 139-146
Studies of Porous Silicon by Electron Microscopy....Pages 147-156
Scanning probe microscopies of luminescent porous silicon layers....Pages 157-162
In-Situ Combined Infrared and Photoluminescence Investigation of Porous Silicon during its Etching....Pages 163-168
Near Surface State in Si and Their Possible Role in the Luminescence of Porous Silicon....Pages 169-178
Porous Silicon Electroluminescence Mechanisms and Defect Analysis....Pages 179-190
Defect and Structure Analysis of n + - and p + -type Porous Silicon by the Electron Paramagnetic Resonance Technique....Pages 191-196
Photoluminescence and Optically Detected Magnetic Resonance Investigations on Porous Silicon....Pages 197-202
Effects of the Reduction of Dielectric Constant in Nanoscale Silicon....Pages 203-210
Quantum Effects in Porous Silicon ?....Pages 211-217
Electronic Properties of Low Dimensional Silicon Structures....Pages 219-228
Role of Silicon Molecules and Crystallites in the Luminescence of Porous Silicon....Pages 229-234
Localisation of excitons on a quantum wire of fluctuating width....Pages 235-239
β¦ Subjects
Condensed Matter Physics;Solid State Physics;Spectroscopy and Microscopy;Optical and Electronic Materials;Characterization and Evaluation of Materials;Geotechnical Engineering &Applied Earth Sciences
π SIMILAR VOLUMES
<p>This Advanced Study Institute on the Electronic Properties of Multilayers and Low Dimensional Semiconductor Structures focussed on several of the most active areas in modern semiconductor physics. These included resonant tunnelling and superlattice phenomena and the topics of ballistic transport,
<p>This volume contains the Proceedings of the NATO Advanced Research Workshop on "Growth and Optical Properties of Wide Gap II-VI Low Dimensional Semiconductors", held from 2 - 6 August 1988 in Regensburg, Federal Republic of Germany, under the auspices of the NATO International Scientific Exchange
<p>This book focuses on the mechanical properties of silicides for very large scale integration (VLSI) applications. It presents the fabrication process for bulk silicides and thin films, and list complete testing deformation for a variety of silicon based compounds. The author also presents disloca