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Optical properties of InN grown on templates with controlled surface polarities

✍ Scribed by Kirste, Ronny ;Wagner, Markus R. ;Schulze, Jan H. ;Strittmatter, Andre ;Collazo, Ramon ;Sitar, Zlatko ;Alevli, Mustafa ;Dietz, Nikolaus ;Hoffmann, Axel


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
236 KB
Volume
207
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

The structural and optical properties of InN layers grown on GaN/sapphire templates with controlled Ga‐/N‐polar surfaces are investigated. Raman spectroscopy and XRD reciprocal space map analysis suggest that the InN layers were grown strain free with a high crystal quality. A line shape analysis of the A~1~(LO) Raman mode yields to a decreasing carrier concentration for the sample grown on Ga‐polar substrate. Low temperature photoluminescence measurements exhibit a shift to lower energies of the luminescence maximum for the sample grown on Ga‐polar GaN probably due to a reduced carrier concentration and thus, a decreased Burstein–Moss shift. Following this, we demonstrate that the use of polarity controlled GaN/sapphire substrates leads to unstrained layers with good structural and optical properties.


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