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Optical properties of Bi2Te2Se thin films

โœ Scribed by E. Kh. Shokr; M. M. Wakkad


Publisher
Springer
Year
1992
Tongue
English
Weight
337 KB
Volume
27
Category
Article
ISSN
0022-2461

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Se 85 Te 10 Bi 5 films of different thicknesses ranging from 126 to 512 nm have been prepared. Energydispersive X-ray (EDX) spectroscopy technique showed that films are nearly stoichiometric. X-ray diffraction (XRD) measurements have showed that the Se 85 Te 10 Bi 5 films were amorphous. Electrical