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Optical parameters of as-deposited and annealed GeSe0.5Te3.5 films

โœ Scribed by E.Kh. Shokr

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
334 KB
Volume
53
Category
Article
ISSN
0022-3697

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The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 ยฐC. X-ray diffraction (XRD) analysis showed that the structural transformation