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Optical near-field induced current microscopy

✍ Scribed by K. Karrai; G. Kolb; G. Abstreiter; A. Schmeller


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
489 KB
Volume
61
Category
Article
ISSN
0304-3991

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## Abstract This manuscript reviews the principles and recent advances of scanning near‐field optical microscopy based on tip‐induced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e