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Optical microscopic, X-ray diffraction, and electrical resistance studies of CuCl at high pressure

✍ Scribed by G.J. Piermarini; F.A. Mauer; S. Block; A. Jayaraman; T.H. Geballe; G.W. Hull Jr.

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 510 KB
Volume: 32
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(79)90946-3

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