๐”– Bobbio Scriptorium
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Optical metrology

โœ Scribed by K.J. Gasvik; J.M. Burch


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
117 KB
Volume
10
Category
Article
ISSN
0141-6359

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Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use o