<p><P>This reference tutorial contains modern experimental approaches to analysis of strain-stress distribution based on interference-optical methods of registration of strain or displacement fields, including coherent-optical techniques (holographic interferometry, speckle photography, electronic d
Optical Methods in Experimental Solid Mechanics
โ Scribed by Karl-Hans Laermann (eds.)
- Publisher
- Springer-Verlag Wien
- Year
- 2000
- Tongue
- English
- Leaves
- 432
- Series
- International Centre for Mechanical Sciences 403
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
The book covers the theories and physics of advanced new optical measuring methods and problems of experimental performance, recent achievements in the basic interferometric methods holography, speckle-interferometry, shearography as well as linear/non-linear photoelasticity and photoviscoelasticity, Moirรฉ- and grid-techniques. It deals with theory and application of digital image processing, methods of data recording, data processing and -visualisation, with mathematical/numerical procedures for final evaluation of digitised measured data and the principle of hybrid techniques. It introduces into the new perceptions of methods in experimental solid mechanics and it should encourage scientists to deal intensively with the theories for further developments, and enables practitioners, to understand theory and physics of the new achievements at least and to apply the methods in research als well as in developments in practice.
โฆ Table of Contents
Front Matter....Pages ii-xii
Hybrid Techniques in Experimental Solid Mechanics....Pages 1-72
Recent Developments in 3-D-Photoelasticity and Grating Strain Measurement....Pages 73-121
Automated In-Plane Moirรฉ Techniques and Grating Interferometry....Pages 123-195
Interferometric Methods....Pages 197-288
Digital Processing and Evaluation of Fringe Patterns in Optical Metrology and Non-Destructive Testing....Pages 289-422
โฆ Subjects
Optics, Optoelectronics, Plasmonics and Optical Devices; Mechanics; Solid State Physics; Spectroscopy and Microscopy; Image Processing and Computer Vision; Pattern Recognition
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