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Optical Measurement of Thermal Conductivity Using Fiber Aligned Frequency Domain Thermoreflectance

โœ Scribed by Malen, Jonathan A.; Baheti, Kanhayalal; Tong, Tao; Zhao, Yang; Hudgings, Janice A.; Majumdar, Arun

Book ID
120317861
Publisher
The American Society of Mechanical Engineers
Year
2011
Tongue
English
Weight
592 KB
Volume
133
Category
Article
ISSN
0022-1481

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Thermal conductivity measurements of low
Thermal conductivity measurements of low-k films using thermoreflectance phenomenon
โœ M. Kuwahara; O. Suzuki; S. Takada; N. Hata; P. Fons; J. Tominaga ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 110 KB

The thermal conductivity of low-dielectric-constant (low-k) materials has been studied by a nano second thermoreflectance measurement system (Nano-TheMS). The Nano-TheMS, which utilizes thermoreflectance, can easily measure the thermal conductivity of thin film of nano-meter scale thickness. We have