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Optical in situ monitoring of solid phase crystallization of amorphous silicon

✍ Scribed by Ralf B. Bergmann

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 272 KB
Volume: 165
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(96)00254-0

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