Optical element for X-ray microscopy

✍ Scribed by G. Chadzitaskos

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 192 KB
• Volume: 629
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2010.10.073

✦ Synopsis

We present a proposal for an X-ray optical element suitable for X-ray microscopy and other X-ray-based optical systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray scattering on a slice of single crystal. These conditions are fulfilled simultaneously due to a properly machined shape of the single crystal with a stress at its ends.