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Optical depth profiling by attenuated total reflection Fourier transform infrared spectroscopy using an incident beam with arbitrary degree of polarization

✍ Scribed by Sanong Ekgasit; Hatsuo Ishida


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
571 KB
Volume
13
Category
Article
ISSN
0924-2031

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