Thickness dependence of optical paramete
โ
A.M. Salem; T.M. Dahy; Y.A. El-Gendy
๐
Article
๐
2008
๐
Elsevier Science
๐
English
โ 638 KB
Zinc telluride thin films with different thicknesses have been deposited by electron beam gun evaporation system onto glass substrates at room temperature. X-ray and electron diffraction techniques have been employed to determine the crystal structure and the particle size of the deposited films. Th