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Optical constants of Bi2Te3and Sb2Te3measured using spectroscopic ellipsometry

โœ Scribed by Hao Cui; I. B. Bhat; R. Venkatasubramanian

Book ID
107458048
Publisher
Springer US
Year
1999
Tongue
English
Weight
152 KB
Volume
28
Category
Article
ISSN
0361-5235

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Thermoelectric properties of materials are essentially based on the thermoelectrical figure of merit \(Z=S^{2} \sigma / K\), where \(S\) is the thermoelectrical power, \(\sigma\) the electrical conductivity and \(K\) the thermal conductivity. Narrow-bandgap semiconductors \(\mathrm{Bi}_{2} \mathrm{T