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Optical constants and critical-point parameters of GaAs from 0.73 to 6.60 eV

✍ Scribed by Zollner, Stefan

Book ID
120221089
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
291 KB
Volume
90
Category
Article
ISSN
0021-8979

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Optical constants and critical-point par
Optical constants and critical-point parameters of GaAs1-xSbxalloy films grown on GaAs
✍ Ben Sedrine, N. ;Gharbi, T. ;Harmand, J. C. ;Chtourou, R. πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 417 KB

## Abstract Spectroscopic Ellipsometry (SE) is used in this work to investigate the optical properties of the GaAs~1–__x__~ Sb__~x~__ alloys. The present study is based on a set of GaAs~1–__x__~ Sb__~x~__ layers (__x__ = 0.0%, 6.7% and 10.8%) grown on GaAs substrate by molecular beam epitaxy (MBE).