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Optical Characterization of Thin Solid Films

✍ Scribed by Olaf Stenzel, Miloslav Ohlídal

Publisher
Springer International Publishing
Year
2018
Tongue
English
Leaves
474
Series
Springer Series in Surface Sciences 64
Edition
1st ed.
Category
Library
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✦ Synopsis

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

✦ Table of Contents

Front Matter ....Pages i-xxiv
Front Matter ....Pages 1-1
Introduction (O. Stenzel, Miloslav Ohlídal)....Pages 3-10
Characterization of Porous Zirconia Samples as an Example of the Interplay Between Optical and Non-optical Characterization Methods (O. Stenzel)....Pages 11-29
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range (Daniel Franta, Jiří Vohánka, Martin Čermák)....Pages 31-82
Predicting Optical Properties from Ab Initio Calculations (Pavel Ondračka, David Holec, Lenka Zajíčková)....Pages 83-104
Front Matter ....Pages 105-105
Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry (Miloslav Ohlídal, Jiří Vodák, David Nečas)....Pages 107-141
Data Processing Methods for Imaging Spectrophotometry (David Nečas)....Pages 143-175
In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basics (Olaf Stenzel, Steffen Wilbrandt)....Pages 177-202
In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Experimental Technique and Application Examples (Steffen Wilbrandt, Olaf Stenzel)....Pages 203-232
Ellipsometry of Layered Systems (Ivan Ohlídal, Jiří Vohánka, Martin Čermák, Daniel Franta)....Pages 233-267
Front Matter ....Pages 269-269
Optical Characterization of Thin Films Exhibiting Defects (Ivan Ohlídal, Martin Čermák, Jiří Vohánka)....Pages 271-313
Scanning Probe Microscopy Characterization of Optical Thin Films (Petr Klapetek)....Pages 315-339
Resonant Waveguide Grating Structures (Stefanie Kroker, Thomas Siefke)....Pages 341-358
Polarization Control by Deep Ultra Violet Wire Grid Polarizers (Thomas Siefke, Stefanie Kroker)....Pages 359-374
Front Matter ....Pages 375-375
Roughness and Scatter in Optical Coatings (M. Trost, S. Schröder)....Pages 377-405
Absorption and Fluorescence Measurements in Optical Coatings (Christian Mühlig)....Pages 407-431
Cavity Ring-Down Technique for Optical Coating Characterization (Christian Karras)....Pages 433-456
Back Matter ....Pages 457-462

✦ Subjects

Physics; Surface and Interface Science, Thin Films; Optical and Electronic Materials; Spectroscopy and Microscopy; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films

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