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Optical characterization of thin and ultrathin surface and buried cubic SiC layers using FTIR spectroscopy

✍ Scribed by T. Zorba; D.I. Siapkas; C.C. Katsidis


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
326 KB
Volume
28
Category
Article
ISSN
0167-9317

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