✦ LIBER ✦

Optical characterization of stereolithography alumina suspensions using the Kubelka–Munk model

✍ Scribed by Y. Abouliatim; T. Chartier; P. Abelard; C. Chaput; C. Delage

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 935 KB
Volume: 29
Category: Article
ISSN: 0955-2219
DOI: 10.1016/j.jeurceramsoc.2008.07.008

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✦ Synopsis

The multiple light scattering in concentrated alumina suspensions adapted to stereolithography can be modeled using diffuse reflectance measurements coupled to the Kubelka-Munk model. The penetration depth of UV radiation can be related to the scattering coefficient allowing the prediction of the cure depth with an accuracy of 20%.