Optical Characterization of Semiconductor Microcavities by Spatially Resolved Imaging and Resonant Rayleigh Scattering

✍ Scribed by Gurioli, M. ;Bogani, F. ;Wiersma, D.S. ;Roussignol, Ph. ;Cassabois, G. ;Khitrova, G. ;Gibbs, H.

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 100 KB
• Volume: 190
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200204)190:2<363::aid-pssa363>3.0.co;2-o