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Optical and morphological study of misoriented GaAs substrates exposed to bismuth flow using in situ spectral reflectance and atomic force microscopy

✍ Scribed by I. Massoudi; M.M. Habchi; A. Rebey; B. El Jani


Book ID
116630328
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
641 KB
Volume
353
Category
Article
ISSN
0022-0248

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