Optical and crystallographic analysis of thin films of GeC deposited using a unique hollow cathode sputtering technique

✍ Scribed by J.L. Huguenin-Love; R.J. Soukup; N.J. Ianno; J.S. Schrader; D.W. Thompson; V.L. Dalal

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 243 KB
• Volume: 9
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2006.08.026